P-9 Test Methods and Procedures

Next Meeting: October 6-9, 2008 Salt Lake City, UT

Meeting Date	Notice	Agenda	Roster	Minutes	Attachments
October 7, 2002	10/07	10/07	10/07	10/07	DSCC (PDF)
April 15, 2002	04/15	04/15	04/15	04/15	—
October 10, 2001	10/10	10/10	10/09	10/09	—
April 25, 2001	04/25	04/25	04/25	04/25	DSCC (PDF)
October 4, 2000	10/04(PDF)	10/04	10/04	10/04	—
April 5, 2000	—	—	—	04/05	—

Committee Scope: Engineering matters pertaining to all types of environmental, electronic, mechanical, process and material test methods used on a variety of passive and electromechanical parts or materials; the appropriate committee or subcommittee will handle test methods concerned with a single part or family of components.

Committee Chairman:

Roster:

Member	Distribution List
Edward Aoki Agilent Technologies William Ebling Vishay Intertechnology, Inc. Richard Groft Tyco Electronics/AMP James Howard Vishay Intertechnology, Inc. Patrick Kyne Defense Supply Center Columbus Christine Pollock Presidio Components, Inc. Mary Sprankle LOCKHEED MARTIN FEDERAL SYSTEMS	Ralph Justus Electronic Components Association

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